@article{(Open Science Index):https://publications.waset.org/pdf/7770,
	  title     = {An Embedded System Design for SRAM SEU Test},
	  author    = {Kyoung Kun Lee and  Soongyu Kwon and  Jong Tae Kim},
	  country	= {},
	  institution	= {},
	  abstract     = {An embedded system for SEU(single event upset) test
needs to be designed to prevent system failure by high-energy particles
during measuring SEU. SEU is a phenomenon in which the data is changed temporary in semiconductor device caused by high-energy particles. In this paper, we present an embedded system for
SRAM(static random access memory) SEU test. SRAMs are on the DUT(device under test) and it is separated from control board which
manages the DUT and measures the occurrence of SEU. It needs to
have considerations for preventing system failure while managing the
DUT and making an accurate measurement of SEUs. We measure the occurrence of SEUs from five different SRAMs at three different
cyclotron beam energies 30, 35, and 40MeV. The number of SEUs of SRAMs ranges from 3.75 to 261.00 in average.},
	    journal   = {International Journal of Computer and Information Engineering},
	  volume    = {5},
	  number    = {12},
	  year      = {2011},
	  pages     = {1689 - 1692},
	  ee        = {https://publications.waset.org/pdf/7770},
	  url   	= {https://publications.waset.org/vol/60},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 60, 2011},
	}