@article{(Open Science Index):https://publications.waset.org/pdf/6717,
	  title     = {Preparation of Nanostructure ZnO-SnO2 Thin Films for Optoelectronic Properties and Post Annealing Influence},
	  author    = {Vipin Kumar Jain and  Praveen Kumar and  Y.K. Vijay},
	  country	= {},
	  institution	= {},
	  abstract     = {ZnO-SnO2 i.e. Zinc-Tin-Oxide (ZTO) thin films were
deposited on glass substrate with varying concentrations (ZnO:SnO2
- 100:0, 90:10, 70:30 and 50:50 wt.%) at room temperature by flash
evaporation technique. These deposited ZTO film were annealed at
450 0C in vacuum. These films were characterized to study the effect
of annealing on the structural, electrical, and optical properties.
Atomic force microscopy (AFM) and Scanning electron microscopy
(SEM) images manifest the surface morphology of these ZTO thin
films. The apparent growth of surface features revealed the formation
of nanostructure ZTO thin films. The small value of surface
roughness (root mean square RRMS) ensures the usefulness in
optical coatings. The sheet resistance was also found to be decreased
for both types of films with increasing concentration of SnO2. The
optical transmittance found to be decreased however blue shift has
been observed after annealing.},
	    journal   = {International Journal of Materials and Metallurgical Engineering},
	  volume    = {6},
	  number    = {12},
	  year      = {2012},
	  pages     = {1204 - 1206},
	  ee        = {https://publications.waset.org/pdf/6717},
	  url   	= {https://publications.waset.org/vol/72},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 72, 2012},
	}