@article{(Open Science Index):https://publications.waset.org/pdf/509,
	  title     = {Average Current Estimation Technique for Reliability Analysis of Multiple Semiconductor Interconnects},
	  author    = {Ki-Young Kim and  Jae-Ho Lim and  Deok-Min Kim and  Seok-Yoon Kim},
	  country	= {},
	  institution	= {},
	  abstract     = {Average current analysis checking the impact of
current flow is very important to guarantee the reliability of
semiconductor systems. As semiconductor process technologies
improve, the coupling capacitance often become bigger than self
capacitances. In this paper, we propose an analytic technique for
analyzing average current on interconnects in multi-conductor
structures. The proposed technique has shown to yield the acceptable
errors compared to HSPICE results while providing computational
efficiency.},
	    journal   = {International Journal of Computer and Information Engineering},
	  volume    = {4},
	  number    = {11},
	  year      = {2010},
	  pages     = {1683 - 1687},
	  ee        = {https://publications.waset.org/pdf/509},
	  url   	= {https://publications.waset.org/vol/47},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 47, 2010},
	}