WASET
    Shuvro Chowdhury and  Esmat Farzana and  Rizvi Ahmed and  A. T. M. Golam Sarwar and  M. Ziaur Rahman Khan,  C-V Characterization and Analysis of Temperature and Channel Thickness Effects on Threshold Voltage of Ultra-thin SOI MOSFET by Self-Consistent Model.   journal   = {International Journal of Nuclear and Quantum Engineering}, [online]. World Academy of Science, Engineering and Technology.
    September 2010, vol. 45(9). 1341 - 1346
    [viewed 20 April 2024]. Available from: https://publications.waset.org/pdf/5060.