Further Thoughtson a Sequential Life Testing Approach Using an Inverse Weibull Model
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Further Thoughtson a Sequential Life Testing Approach Using an Inverse Weibull Model

Authors: D. I. De Souza, G. P. Azevedo, D. R. Fonseca

Abstract:

In this paper we will develop further the sequential life test approach presented in a previous article by [1] using an underlying two parameter Inverse Weibull sampling distribution. The location parameter or minimum life will be considered equal to zero. Once again we will provide rules for making one of the three possible decisions as each observation becomes available; that is: accept the null hypothesis H0; reject the null hypothesis H0; or obtain additional information by making another observation. The product being analyzed is a new electronic component. There is little information available about the possible values the parameters of the corresponding Inverse Weibull underlying sampling distribution could have.To estimate the shape and the scale parameters of the underlying Inverse Weibull model we will use a maximum likelihood approach for censored failure data. A new example will further develop the proposed sequential life testing approach.

Keywords: Sequential Life Testing, Inverse Weibull Model, Maximum Likelihood Approach, Hypothesis Testing.

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1059431

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References:


[1] Daniel I. De Souza, "Sequential Life-Testing with Truncation Mechanisms for Underlying Three-Parameter Weibull and Inverse Weibull Models," COMADEM 2004Conference,Cambridge, U.K.,pp. 260-271, August 2004.
[2] P. Erto, "New Practical Bayes Estimators for the 2-Parameter Weibull Distribution", IEEE Transactions on Reliability, vol. R-31, n. 2, pp. 194- 197, June 1982.
[3] Leonard. R. Lamberson and Daniel I. De Souza; "Bayesian Weibull Estimation", 1987 - ASQC Quality Congress Transactions, Minneapolis, pp. 497-506, 1987.
[4] Daniel I. De Souza and Leonard R.Lamberson, "Bayesian Weibull Reliability Estimation", IIE Transactions, 27(3), pp. 311-320; 1995.
[5] K. Kapur and L. R. Lamberson, Reliability in Engineering Design. New York:John Willey & Sons, Inc., 1977.