WASET
    Sheng-Shu Cheng and  Fong-Jung Yu,  A CUSUM Control Chart to Monitor Wafer Quality.   journal   = {International Journal of Industrial and Manufacturing Engineering}, [online]. World Academy of Science, Engineering and Technology.
    June 2013, vol. 78(6). 1183 - 1188
    [viewed 29 March 2024]. Available from: https://publications.waset.org/pdf/418.