Appling Eyring-s Accelerated Life Testing Model to “Times to Breakdown“ of Insulating Fluid: A Combined Approach of an Accelerated and a Sequential Life Testing
Commenced in January 2007
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Appling Eyring-s Accelerated Life Testing Model to “Times to Breakdown“ of Insulating Fluid: A Combined Approach of an Accelerated and a Sequential Life Testing

Authors: D. I. De Souza, D. R. Fonseca, D. Kipper

Abstract:

In this paper, the test purpose will be to assess whether or not the accelerated model proposed by Eyring will be able to translate results for the shape and scale parameters of an underlying Weibull model, obtained under two accelerating using conditions, to expected normal using condition results for these parameters. The product being analyzed is a new type of insulate fluid, and the accelerating factor is the voltage stresses applied to the fluid at two different levels (30KV and 40KV). The normal operating voltage is 25KV. In this case, it was possible to test the insulate fluid at normal voltage using condition. Both results for the two parameters of the Weibull model, obtained under normal using condition and translated from accelerated using conditions to normal conditions, will be compared to each other to assess the accuracy of the Eyring model when the accelerating factor is only the voltage stress.

Keywords: Eyring Accelerated Model, Sequential Life Testing, Two-Parameter Weibull Distribution, Voltage Stresses.

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1331609

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References:


[1] D. I. De Souza, "A Sequential Life Testing Applied to an Accelerated Life Testing with an Underlying Three-Parameter Weibull Model. A Maximum Likelihood Approach," in Proc COMADEM 2006 Conference, Lulea, Sweden, 2006, pp. 495-504, June 12- 15.
[2] K. Kapur and L. R. Lamberson, Reliability in Engineering Design. New York: John Willey & Sons, 1977, pp. 216-217.
[3] D. I. De Souza, "Application of a Sequential Life Testing with a Truncation Mechanism for an Underlying Three-Parameter Weibull Model," in ESREL 2004 - PSAM 7 Conference, Berlin, Germany, 2004, Vol 3; pp. 1674-1680, June 14-18.
[4] D. I. De Souza, « Sequential Life Testing with a Truncation Mechanism for an Underlying Weibull Model," Towards a Safer World, ESREL Conference, Torino, Italy, 2001, V. 3, pp. 1539 - 1546, September 16- 20.
[5] A. M. Mood and F. A. Graybill, Introduction to the Theory of Statistics. Second Edition. New York, 1963, pp. 235-236.
[6] Nelson, W. B. (1982). Applied Life Data Analysis. John Willey & Sons, New York, 1982, pp. 105.