@article{(Open Science Index):https://publications.waset.org/pdf/3071,
	  title     = {A Sub-Pixel Image Registration Technique with Applications to Defect Detection},
	  author    = {Zhen-Hui Hu and  Jyh-Shong Ju and  Ming-Hwei Perng},
	  country	= {},
	  institution	= {},
	  abstract     = {This paper presents a useful sub-pixel image
registration method using line segments and a sub-pixel edge detector.
In this approach, straight line segments are first extracted from gray
images at the pixel level before applying the sub-pixel edge detector.
Next, all sub-pixel line edges are mapped onto the orientation-distance
parameter space to solve for line correspondence between images.
Finally, the registration parameters with sub-pixel accuracy are
analytically solved via two linear least-square problems. The present
approach can be applied to various fields where fast registration with
sub-pixel accuracy is required. To illustrate, the present approach is
applied to the inspection of printed circuits on a flat panel. Numerical
example shows that the present approach is effective and accurate
when target images contain a sufficient number of line segments,
which is true in many industrial problems.},
	    journal   = {International Journal of Computer and Information Engineering},
	  volume    = {2},
	  number    = {5},
	  year      = {2008},
	  pages     = {1411 - 1416},
	  ee        = {https://publications.waset.org/pdf/3071},
	  url   	= {https://publications.waset.org/vol/17},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 17, 2008},
	}