WASET
    Z. X. Chen and  T. S. Phua and  X. P. Wang and  G. -Q. Lo and  D. -L. Kwong,  Impact of Process Variations on the Vertical Silicon Nanowire Tunneling FET (TFET) .   journal   = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    September 2013, vol. 81(9). 1233 - 1236
    [viewed 26 April 2024]. Available from: https://publications.waset.org/pdf/16702.