Shibesh Dutta and Sivaramakrishnan R. and Sundar Gopalan and Balakrishnan Shankar, Electrical Characterization and Reliability Analysis of HfO2-TiO2-Al MOSCAPs. journal = {International Journal of Materials and Metallurgical Engineering}, [online]. World Academy of Science, Engineering and Technology. October 2009, vol. 34(10). 555 - 557 [viewed 20 September 2024]. Available from: https://publications.waset.org/pdf/16005.