@article{(Open Science Index):https://publications.waset.org/pdf/15871,
	  title     = {Effective Defect Prevention Approach in Software Process for Achieving Better Quality Levels},
	  author    = {Suma. V. and  T. R. Gopalakrishnan Nair},
	  country	= {},
	  institution	= {},
	  abstract     = {Defect prevention is the most vital but habitually
neglected facet of software quality assurance in any project. If
functional at all stages of software development, it can condense the
time, overheads and wherewithal entailed to engineer a high quality
product. The key challenge of an IT industry is to engineer a
software product with minimum post deployment defects.
This effort is an analysis based on data obtained for five selected
projects from leading software companies of varying software
production competence. The main aim of this paper is to provide
information on various methods and practices supporting defect
detection and prevention leading to thriving software generation. The
defect prevention technique unearths 99% of defects. Inspection is
found to be an essential technique in generating ideal software
generation in factories through enhanced methodologies of abetted
and unaided inspection schedules. On an average 13 % to 15% of
inspection and 25% - 30% of testing out of whole project effort time
is required for 99% - 99.75% of defect elimination.
A comparison of the end results for the five selected projects
between the companies is also brought about throwing light on the
possibility of a particular company to position itself with an
appropriate complementary ratio of inspection testing.},
	    journal   = {International Journal of Industrial and Manufacturing Engineering},
	  volume    = {2},
	  number    = {6},
	  year      = {2008},
	  pages     = {662 - 666},
	  ee        = {https://publications.waset.org/pdf/15871},
	  url   	= {https://publications.waset.org/vol/18},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 18, 2008},
	}