%0 Journal Article
	%A Bhatti A. and  Nahavandi S. and  Hossny M.
	%D 2009
	%J International Journal of Computer and Information Engineering
	%B World Academy of Science, Engineering and Technology
	%I Open Science Index 25, 2009
	%T Haptics Enabled Offline AFM Image Analysis
	%U https://publications.waset.org/pdf/15621
	%V 25
	%X Current advancements in nanotechnology are dependent
on the capabilities that can enable nano-scientists to extend their eyes
and hands into the nano-world. For this purpose, a haptics (devices
capable of recreating tactile or force sensations) based system for
AFM (Atomic Force Microscope) is proposed. The system enables
the nano-scientists to touch and feel the sample surfaces, viewed
through AFM, in order to provide them with better understanding of
the physical properties of the surface, such as roughness, stiffness and
shape of molecular architecture. At this stage, the proposed work uses
of ine images produced using AFM and perform image analysis to
create virtual surfaces suitable for haptics force analysis. The research
work is in the process of extension from of ine to online process
where interaction will be done directly on the material surface for
realistic analysis.
	%P 81 - 86