Robust Ellipse Detection by Fitting Randomly Selected Edge Patches
Commenced in January 2007
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Robust Ellipse Detection by Fitting Randomly Selected Edge Patches

Authors: Watcharin Kaewapichai, Pakorn Kaewtrakulpong

Abstract:

In this paper, a method to detect multiple ellipses is presented. The technique is efficient and robust against incomplete ellipses due to partial occlusion, noise or missing edges and outliers. It is an iterative technique that finds and removes the best ellipse until no reasonable ellipse is found. At each run, the best ellipse is extracted from randomly selected edge patches, its fitness calculated and compared to a fitness threshold. RANSAC algorithm is applied as a sampling process together with the Direct Least Square fitting of ellipses (DLS) as the fitting algorithm. In our experiment, the method performs very well and is robust against noise and spurious edges on both synthetic and real-world image data.

Keywords: Direct Least Square Fitting, Ellipse Detection, RANSAC

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1082877

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