Reliable Face Alignment Using Two-Stage AAM
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Reliable Face Alignment Using Two-Stage AAM

Authors: Sunho Ki, Daehwan Kim, Seongwon Cho, Sun-Tae Chung, Jaemin Kim, Yun-Kwang Hong, Chang Joon Park, Dongmin Kwon, Minhee Kang, Yusung Kim, Younghan Yoon

Abstract:

AAM (active appearance model) has been successfully applied to face and facial feature localization. However, its performance is sensitive to initial parameter values. In this paper, we propose a two-stage AAM for robust face alignment, which first fits an inner face-AAM model to the inner facial feature points of the face and then localizes the whole face and facial features by optimizing the whole face-AAM model parameters. Experiments show that the proposed face alignment method using two-stage AAM is more reliable to the background and the head pose than the standard AAM-based face alignment method.

Keywords: AAM, Face Alignment, Feature Extraction, PCA

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1082627

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