@article{(Open Science Index):https://publications.waset.org/pdf/13780,
	  title     = {Integration of Resistive Switching Memory Cell with Vertical Nanowire Transistor},
	  author    = {Xiang Li and  Zhixian Chen and  Zheng Fang and  Aashit Kamath and  Xinpeng Wang and  Navab Singh and  Guo-Qiang Lo and  Dim-Lee
Kwong},
	  country	= {},
	  institution	= {},
	  abstract     = {We integrate TiN/Ni/HfO2/Si RRAM cell with a
vertical gate-all-around (GAA) nanowire transistor to achieve
compact 4F2 footprint in a 1T1R configuration. The tip of the Si
nanowire (source of the transistor) serves as bottom electrode of the
memory cell. Fabricated devices with nanowire diameter ~ 50nm
demonstrate ultra-low current/power switching; unipolar switching
with 10μA/30μW SET and 20μA/30μW RESET and bipolar switching
with 20nA/85nW SET and 0.2nA/0.7nW RESET. Further, the
switching current is found to scale with nanowire diameter making the
architecture promising for future scaling.},
	    journal   = {International Journal of Electronics and Communication Engineering},
	  volume    = {6},
	  number    = {9},
	  year      = {2012},
	  pages     = {918 - 920},
	  ee        = {https://publications.waset.org/pdf/13780},
	  url   	= {https://publications.waset.org/vol/69},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 69, 2012},
	}