Z. Fang and H.Y. Yu and W.J. Liu and N. Singh and G.Q. Lo, Resistive RAM Based on Hfox and its Temperature Instability Study. journal = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology. December 2010, vol. 48(12). 1836 - 1838 [viewed 25 April 2024]. Available from: https://publications.waset.org/pdf/1308.