Optimization and Determination of Process Parameters in Thin Film SOI Photo-BJMOSFET
Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 32797
Optimization and Determination of Process Parameters in Thin Film SOI Photo-BJMOSFET

Authors: Hai-Qing Xie, Yun Zeng, Yong-Hong Yan, Guo-Liang Zhang, Tai-Hong Wang

Abstract:

We propose photo-BJMOSFET (Bipolar Junction Metal-Oxide-Semiconductor Field Effect Transistor) fabricated on SOI film. ITO film is adopted in the device as gate electrode to reduce light absorption. I-V characteristics of photo-BJMOSFET obtained in dark (dark current) and under 570nm illumination (photo current) are studied furthermore to achieve high photo-to-dark-current contrast ratio. Two variables in the calculation were the channel length and the thickness of the film which were set equal to six different values, i.e., L=2, 4, 6, 8, 10, and 12μm and three different values, i.e., dsi =100, 200 and 300nm, respectively. The results indicate that the greatest photo-to-dark-current contrast ratio is achieved with L=10μm and dsi=200 nm at VGK=0.6V.

Keywords: Photo-to-dark-current contrast ratio, Photo-current, Dark-current, Process parameter

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1078358

Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 1392

References:


[1] SM Csutak, JD Schaub, WE Wu, R Shimer, JC Campbell, "CMOS-compatible high-speed planar silicon photodiodes fabricated on SOI substrates," IEEE J Quantum Electron, vol.38, pp.193-196, Feb 2002.
[2] Lin Kea, Xin Yue Zhaoa, Ramadas Senthil Kumara and Soo Jin Chua, "Low frequency optical noise from organic light emitting diode," Solid-State Electronics, vol.52, pp.7-10, Jan 2008.
[3] S Nakaharai, T Tezuka, N Hirashita, E Toyoda, Y Moriyama, N Sugiyama, et al "The generation of crystal defects in Ge-on-insulator (GOI) layers in the Ge-condensation process," Semiconductor science and technology, vol. 22, pp. 26-28, Jan 2007.
[4] K. Wang, Y. Vygranenko and A. Nathan, "Optically transparent ZnO-based n-i-p ultraviolet photodetectors," Thin Solid Films, vol.515, pp. 6981-6985, June 2007.
[5] HS Wong, Y Heights, " Technology and device scaling considerations for CMOS imagers,"IEEE Trans.Electron Devices, vol.43, pp.2131-2142, Dec 1996
[6] Nh Zhu, Y Liu, SJ Zhang, JM Wen, "Bonding-wire compensation effect on the packaging parasitics of optoelectronic devices," Microwave and Optical Technology Letters, vol.48, pp. 76-79, Jan 2006.
[7] Y. W. Park and S. Rhee, "Study of a line width estimation model for laser micro material processing using a photodiode," Optics & Laser Technology, vol.39, pp. 1461-1471, July 2007.
[8] S. D. Gunapala, S. V. Bandara, J. K. Liu, E. M. Luong, S. B. Rafol, J. M. Mumolo, D. Z. Ting, et al, "Quantum well infrared photodetector research and development at Jet Propulsion Laboratory" Infrared Physics & Technology, vol.50, pp.211-216, Feb 2007.
[9] A. J. Blanksby, M. J. Loinaz, "Performance analysis of a color CMOS photogate image sensor," IEEE Trans ,Electron Devices, vol.47, pp. 55-64, Jan 2000.
[10] Fábio Alencar Mendonça, Rubens Viana Ramos, "Optical receiver for instrumentation and communication," Microwave and Optical Technology Letters, vol. 45, pp. 415-419, May 2005.
[11] ATLAS Users Manual, SILVACA, Inc.,Santa Clara, CA, 2003
[12] A. T. Hatzopoulos, N. Arpatzanis, D. H. Tassis, C. A. Dimitriadis , F. Templier, M. Oudwan et al, "Electrical and noise characterization of bottom-gated nanocrystalline silicon thin-film transistors," J. Appl. Phys, vol.100, pp.114-117, Dec 2006.