@article{(Open Science Index):https://publications.waset.org/pdf/11455, title = {Methodology of Realization for Supervisor and Simulator Dedicated to a Semiconductor Research and Production Factory }, author = {Hanane Ondella and Pierre Ladet and David Ferrand and Pat Sloan}, country = {}, institution = {}, abstract = {In the micro and nano-technology industry, the «clean-rooms» dedicated to manufacturing chip, are equipped with the most sophisticated equipment-tools. There use a large number of resources in according to strict specifications for an optimum working and result. The distribution of «utilities» to the production is assured by teams who use a supervision tool. The studies show the interest to control the various parameters of production or/and distribution, in real time, through a reliable and effective supervision tool. This document looks at a large part of the functions that the supervisor must assure, with complementary functionalities to help the diagnosis and simulation that prove very useful in our case where the supervised installations are complexed and in constant evolution.}, journal = {International Journal of Mechanical and Mechatronics Engineering}, volume = {1}, number = {4}, year = {2007}, pages = {171 - 176}, ee = {https://publications.waset.org/pdf/11455}, url = {https://publications.waset.org/vol/4}, bibsource = {https://publications.waset.org/}, issn = {eISSN: 1307-6892}, publisher = {World Academy of Science, Engineering and Technology}, index = {Open Science Index 4, 2007}, }