WASET
    Jun Sung Go and  Jong Kang Park and  Jong Tae Kim ,  Single Event Transient Tolerance Analysis in 8051 Microprocessor Using Scan Chain.   journal   = {International Journal of Electrical and Computer Engineering}, [online]. World Academy of Science, Engineering and Technology.
    November 2017, vol. 121(1). 51 - 54
    [viewed 19 April 2024]. Available from: https://publications.waset.org/pdf/10006123.