WASET
    A. U. Moreh and  M. Momoh and  H. N. Yahya and  B. Hamza and  I. G. Saidu and  S. Abdullahi,  Effect of Thickness on Structural and Electrical Properties of CuAlS2 Thin Films Grown by Two Stage Vacuum Thermal Evaporation Technique.   journal   = {International Journal of Physical and Mathematical Sciences}, [online]. World Academy of Science, Engineering and Technology.
    January 2014, vol. 91(7). 1084 - 1088
    [viewed 26 April 2024]. Available from: https://publications.waset.org/pdf/10003559.